search for: e5ce354c

Displaying 2 results from an estimated 2 matches for "e5ce354c".

2013 Jun 30
0
[LLVMdev] [LNT] Question about results reliability in LNT infrustructure
> Getting 10 samples at different commits will give you similar accuracy if > behaviour doesn't change, and you can rely on 10-point blocks before and > after each change to have the same result. Right. But this way you will have 10-commits delay. So, you will need 3-4 additional test runs to pinpoint the offending commit in the worst case. > This is why I proposed something like
2013 Jun 30
6
[LLVMdev] [LNT] Question about results reliability in LNT infrustructure
On 30 June 2013 10:14, Anton Korobeynikov <anton at korobeynikov.info> wrote: > 1. Increasing sample size to at least 5-10 > That's not feasible on slower systems. A single data point takes 1 hour on the fastest ARM board I can get (Chromebook). Getting 10 samples at different commits will give you similar accuracy if behaviour doesn't change, and you can rely on 10-point